Atomic Force Microscopy/Scanning Tunneling Microscopy 2Samuel H. Cohen, Marcia L. Lightbody Semiconductor characterization and adsorbate characterization; Scanning tunneling microscopy for very large-scale integration (VLSI) inspection; Scanning tunneling microscopy-based fabrication of nanometer scale structures; A microscopy for our time; Scanning tunneling microscopy of chemical vapor deposition diamond film: growth on highly oriented pyrolytic graphite and silicon; Scanning tunneling microscopy and atomic force microscopy of chemical-vapor=deposition diamond and diamond-like carbon thin films; Atomic resolution ultrahigh vacuum scanning tunneling microscopy of diamond (100) epitaxial films; Scanning force microscopy characterization of biopolymer films: gelatin on mica; gasification studies of graphite surface by scanning tunneling microscopy; Scanning tunneling microscopy studies of hydrocarbons adsorbed on graphite surfaces; Biological and chemical nanostructure; Visualization of the surface degradation of biomedical polymers in situ; Scanning tunneling microscopy investigations on heteroepitaxially grown overlayers of Cu-phthalocyanine on Au(111) surfaces; Characterization of poly(tetrafluoreethylene) surfaces by atomic force microscopy-results and artifactrs; Scanning probe microscopy studies of isocyanide functionalized polyaniline thin films; New developments in AFM/STM; Investigations of the topographic and spectroscopic imaging by the scanning tunneling microscopy; Observing reactions via flow injection scanning tunneling microscopy; Advances in piezoresistive cantilevers for atomic force microscopy; nanometer-scale qualitative analysis of surfaces with a modified Scanning tunneling microscope/field emission source; Atomic force microscopy imaging of single ion impacts on mica; AFM/STM in materials science; Applications of atomic force microscopy in optical fiber research; Atomic force microscopy studies on optical fiber; Scanning tunneling microscopy studies of solvent-deposited materials on highly oriented pyrolytic graphite; In situ study of stainless steel's passive layer exposed to HC1 using a Scanning tunneling microscope; Application of magnetic force microscopy in magnetic recording; Scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy; Current versus voltage characteristics for deposition and reoval of gold nanostructures on a gold surface using scanning tunneling microscopy; Atomic force microscopy of ion-beam modified carbon fibers; Index. |
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Contents
Figure 3 Molecular structure of CuPc | 103 |
Figure 5 Model for the heteroepitaxy of CuPc on Au | 104 |
25 | 200 |
Other editions - View all
Atomic Force Microscopy/Scanning Tunneling Microscopy 2 Samuel H. Cohen,Marcia L. Lightbody Limited preview - 2013 |
Atomic Force Microscopy/Scanning Tunneling Microscopy 2 Samuel H. Cohen,Marcia L. Lightbody No preview available - 2014 |
Atomic Force Microscopy/Scanning Tunneling Microscopy 2 Samuel H. Cohen,Marcia L. Lightbody No preview available - 2013 |
Common terms and phrases
adhesion adsorbed AFM images angle applied atomic force microscopy Atomic Force Microscopy/Scanning atomic resolution basal plane bias bundles characterization chemical coating contact mode AFM corrosion CuPc defects deposition diameter diamond film Digital Instruments dimer epitaxial etched PTFE fabrication fiber surface Figure 1(a films grown Force Microscopy/Scanning Tunneling friction functional groups gasification gelatin graphite surface growth height hexagonal HOPG hydrogen interactions laser layer Lett material measured mechanical metal mica micrograph Microscopy/Scanning Tunneling Microscopy molecular molecules nanometer Nanoscope nanostructure observed obtained optical fiber orientation passive film Phys piezoresistive cantilever polyaniline polymer PTFE pyrolytic graphite region sample scanning electron scanning probe Scanning Probe Microscopy scanning tunneling microscopy SH groups shown in Figure shows silica silicon solution spĀ² bonded spectroscopy STM image structure substrate tape techniques temperature thin films thiols tip-sample topography transformed film tunneling current VLSI voltage width ZBLAN