X-ray Characterization of MaterialsEric Lifshin Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods. |
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absorption allows Anal analysis analyte angle atomic number axis background Bragg Bragg angle Bravais lattices Chem coefficient Cryst crystal structure crystallite curve defined density detector diffraction pattern diffraction peaks diffractometer dispersive system distance edge effects electron element energy dispersive equation error EXAFS excitation experimental factor field Figure film first fit fitting Fourier transform function incident beam incoherent scattering influence intensity ions lattice parameters Laue layer linear materials matrix measured ment method monochromator neutron obtained particles phase photon Phys Pizzini plane polymer powder diffraction procedure profile quantitative range reciprocal lattice reflection resolution Rietveld sample scat scattering shown in Fig shows single crystal small-angle Snyder solution space space group specific specimen spectrometer spectrum standard surface symmetry synchrotron radiation technique tering tion topography tron typically unit cell vector wave wavelength wavelength dispersive white radiation X-ray beam X-ray diffraction X-ray photon X-ray tube