X-ray Diffraction at Elevated Temperatures: A Method for in Situ Process Analysis

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VCH, 1993 - Science - 268 pages
A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR

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Contents

Review of Xray Diffraction
1
Instrumentation of Xray Diffraction at Elevated
129
In Situ Process Analysis at Elevated Temperatures
189
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