X-ray Diffraction at Elevated Temperatures: A Method for in Situ Process AnalysisA textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR |
Contents
Review of Xray Diffraction | 1 |
Instrumentation of Xray Diffraction at Elevated | 129 |
In Situ Process Analysis at Elevated Temperatures | 189 |
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absorption addition analysis angle Appl application atoms axis beam camera collection composition constant cooling counter crystal depends described detector determined diffraction pattern diffractometer direction distance effect electron element energy example experiments factor Figure film function furnace given gives growth heater heating hexagonal high-temperature incident intensity involves kinetics lattice layer limited linear liquid material measurement melting metal method normal observed obtained occur operation parameters peaks phase photon plane plate position powder produced radiation range reaction reciprocal reduced reflections relation reported resistance resolution rotation sample scanning scattering shown single solid space space group structure symmetry synchrotron technique temperature texture thermal thermocouple tion transformation transition tube unit cell usually vectors wavelength width wire x-ray diffraction