X-ray Diffraction at Elevated Temperatures: A Method for in Situ Process AnalysisA textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR |
Contents
Review of Xray Diffraction | 1 |
Instrumentation of Xray Diffraction at Elevated | 129 |
In Situ Process Analysis at Elevated Temperatures | 189 |
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absorption anode Appl atoms Bragg angle camera composition cooling counter crystalline Crystallogr Crystallography cubic determined diffraction at elevated diffraction pattern diffraction peaks diffractometer direction electrical resistance electron element elevated temperatures energy example F(hkl Figure film function furnace goniometer heater heating hexagonal high-temperature image plate incident beam Instrum intensity kinetics lattice constants lattice parameters lattice plane lattice point linear liquid material measurement melting metal method mirror plane monitored monochromator normal obtained optical orthorhombic perature phase transformation phase transition photon position position-sensitive detector powder diffraction powder lines process analysis range reaction reciprocal lattice reciprocal space resolution rotation axis sample holder scanning scattering single crystal single-crystal space group sphere of reflection symmetry synchrotron radiation technique tetragonal texture thermal expansion thermocouple tion unit cell vectors wavelength width wire x-ray beam x-ray diffraction x-ray photons x-ray source x-ray tube