Recent Advances in X-ray Characterization of Materials, Volume 2

absorption edge Acta Cryst amplitude analysis Appl atoms axis Bragg angle Bragg reflections calculated catalyst characterization Chem clusters components corresponding crystal monochromator detector determined diffracted beam diffraction patterns diffractometer diffuse intensity distribution divergent beam DXS intensity DXS measurements elastic electron epitaxial epitaxial structure equation EXAFS experimental F.W. Lytle function GaAs high pressure incident beam incommensurately modulated interface lattice parameter layer materials metal method modulated structures modulation wave-vector monochromator neutron neutron scattering observed obtained orientation peak perpendicular phase photon photon energy Phys plane point defects reciprocal lattice reciprocal space Relp rocking curves rotation sample satellite reflections scan shown in Fig solid specimen spectrum strain strain tensor stress structure factor substrate super-space surface symmetry synchrotron radiation technique temperature tensor thermal thickness transform unit cell values vector wavelength Weissmann x-ray diffraction X-ray scattering XANES zeolite