Proceedings of the Annual Conference on Industrial Applications of X-ray Analysis, Volume 1Plenum Press, 1960 - X-rays |
Contents
PROJECT VANGUARD | 13 |
THE NEW HILGER MICROFOCUS XRAY GENERATOR | 17 |
A SIMPLIFIED PROCEDURE FOR CALCULATING | 37 |
Copyright | |
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Common terms and phrases
absorption accuracy alloy alpha analyzing crystal anode atomic number background beta beta peak beta-excited bremsstrahlung calibration carbide carbon blacks chemical chromium collimator columbium composition concentration copper counting rate counts per second curve detector determined diameter dilution dilution equation effects electron beam elements emission energy equation error factor film fluorescence goniometer graphite instrument internal standard iron kyanite lattice layer lens lithium fluoride material matrix measured metal method microns microscope mixture molybdenum nickel Norelco obtained optical oxide oxygen particles peak percent phase photon plane powder proportional counter pulse quantitative quartz radiation range rare earth ratio reflection ruthenium sample holder satellite scintillation counter shown in Figure shows silicon slit solution specimen spectral spectrometer steel surface TABLE tantalum target techniques tion titanium tungsten uranium values voltage wavelength X-ray beam X-ray diffraction X-ray intensity X-Ray Microscope X-ray source X-ray spectrograph X-ray tube