Materials Science and Technology: A Comprehensive TreatmentEric Lifshin, Robert W. Cahn, Peter Haasen, Edward J. Kramer This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. From the Contents: DiNardo: Scanning Tunneling Microscopy. De Batist: Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons |
Contents
Contents | 4 |
11 | 12 |
Professor David L Allara Dr Alfred Cerezo | 18 |
Copyright | |
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Materials Science and Technology: A Comprehensive Treatment Robert Wolfgang Cahn,Peter Haasen,Edward J. Kramer No preview available - 1994 |
Common terms and phrases
absorption acoustic alloy amplitude analyzed angle applications atom probe atomic number Auger backscattering calculated channeling chemical composition counting cross section crystal curve density depth profiling detection detector diffraction distribution electron beam energy ergy example Exner experimental factor Figure film fraction frequency function geometry grain boundaries incident Instrum intensity interaction interface ion beam ion beam analysis layer Lett linear magnetic materials mathematical morphology measured ment metal method microprobe microscope microstructural neutron neutron scattering Nucl nuclear reaction analysis obtained parameters particles peak phase Phys PIXE planar polymers proton pulse quantitative ratio Rayleigh waves Rutherford backscattering sample scanning scattering sensitivity shown in Fig signal solid spatial specimen spectra spectrometer spectroscopy spectrum standard Stereology structure substrate superconductors surface techniques temperature thermal thickness thin tion tron tunneling voltage volume wave wavelength X-ray YBCO