Materials Science and Technology: A Comprehensive Treatment

Front Cover
Eric Lifshin, Robert W. Cahn, Peter Haasen, Edward J. Kramer
VCH, 1991 - Materials - 776 pages
This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics.

From the Contents:
DiNardo: Scanning Tunneling Microscopy. De Batist:
Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons

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Contents

Contents
4
11
12
Professor David L Allara Dr Alfred Cerezo
18
Copyright

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