Transmission Electron Microscopy: A Textbook for Materials Science, Volume 1

Front Cover
Springer Science & Business Media, Aug 5, 2009 - Science - 760 pages

This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition.

Praise for the first edition:

`The best textbook for this audience available.' – American Scientist

`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope

`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron

`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998

`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley

 

Contents

Part 1 Basics
2
The Transmission Electron Microscope
3
Scattering and Diffraction
23
Elastic Scattering
39
Inelastic Scattering and Beam Damage
53
Electron Sources
73
Lenses Apertures and Resolution
91
How to See Electrons
115
Part 3 Imaging
370
Amplitude Contrast
371
PhaseContrast Images
389
Thickness and Bending Effects
407
Planar Defects
419
Imaging Strain Fields
441
WeakBeam DarkField Microscopy
463
HighResolution TEM
483

Pumps and Holders
127
The Instrument
141
Specimen Preparation
173
Part 2 Diffraction
196
Diffraction in TEM
197
Thinking in Reciprocal Space
211
Diffracted Beams
221
Bloch Waves
235
Dispersion Surfaces
245
Diffraction from Crystals
257
Diffraction from Small Volumes
271
Obtaining and Indexing ParallelBeam Diffraction Patterns
283
Kikuchi Diffraction
311
Obtaining CBED Patterns
323
Using ConvergentBeam Techniques
347
Other Imaging Techniques
511
Image Simulation
533
Processing and Quantifying Images
549
Part 4 Spectrometry
579
Xray Spectrometry
581
Xray Spectra and Images
605
Qualitative Xray Analysis and Imaging
625
Quantitative Xray Analysis
639
Spatial Resolution and Minimum Detection
663
Electron EnergyLoss Spectrometers and Filters
679
LowLoss and NoLoss Spectra and Images
699
High EnergyLoss Spectra and Images
715
Fine Structure and Finer Details
741
Index
L-1
Copyright

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