Properties and MicrostructureR. K. MacCrone |
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Contents
Direct Observation of Defects | 1 |
Lattice and Structure Imaging | 29 |
Crystal Defects in Integrated Circuits | 47 |
Copyright | |
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anisotropy annealing Appl applied atoms behavior bodies Booker Bradt Ceram composition compressive strength crack crystalline damage decrease defects demagnetizing density devices diffusion dislocations domain walls dopant effects elastic properties electron microscopy epitaxial equation etching failure ferrimagnetic ferrites fibers flaw fracture energy frequency function garnet glass grain boundary grain size growth Hasselman hot-pressed implanted impurities increasing indicated Ion Implantation ions J/m² lattice loop magnetic field magnetic moment magnetostatic materials mechanical melt metals microplastic microstructural dependence nucleation observed occur orientation oxide oxygen parameters particles permeability phase Phys plane polycrystalline pores porosity porosity dependence precipitation Proc rare earth region resonance Rice room temperature sample saturation magnetization shown in Fig shows silicon single crystal sintering specimen spherical spin waves spinel stacking faults stress structure sublattice substrate surface Table techniques theory thermal values volume fraction wafer Young's modulus yttrium yttrium iron garnet