1985 Spring Meeting: Final Program and Abstracts, Materials Research Society 1985 Spring Meeting, April 15-18 Golden Gateway Holiday Inn, San Francisco, California |
From inside the book
Results 1-3 of 9
Page 198
... SOFT X - RAY OPTICS Chair : J. Underwood Tuesday Morning , April 16 , California Room · · P. Pianetta 8:30 * G1.1 ... X - ray Mirrors for Sychrotron Radiation , V. Rehn , Michelson Laboratory , China Lake , CA 9:50 G1.3 Synchrotron ...
... SOFT X - RAY OPTICS Chair : J. Underwood Tuesday Morning , April 16 , California Room · · P. Pianetta 8:30 * G1.1 ... X - ray Mirrors for Sychrotron Radiation , V. Rehn , Michelson Laboratory , China Lake , CA 9:50 G1.3 Synchrotron ...
Page 202
... SOFT X - RAY REGIME . R. J. Bartlett , D. R. Kania and W. J. Trela , Physics Division , Los Alamos National Laboratory , Los Alamos , NM 87545 . The development of new x - ray optics has important applications in a wide variety of ...
... SOFT X - RAY REGIME . R. J. Bartlett , D. R. Kania and W. J. Trela , Physics Division , Los Alamos National Laboratory , Los Alamos , NM 87545 . The development of new x - ray optics has important applications in a wide variety of ...
Page 212
... X - ray detectors with resolutions approaching those found in HPGe or Si ( Li ) detectors . For example ... soft x - ray detectors in the 1-4 KeV range . G4.7 HIGH - RESOLUTION IMAGING DETECTORS FOR USE AT SOFT X - RAY WAVELENGTHS . J ...
... X - ray detectors with resolutions approaching those found in HPGe or Si ( Li ) detectors . For example ... soft x - ray detectors in the 1-4 KeV range . G4.7 HIGH - RESOLUTION IMAGING DETECTORS FOR USE AT SOFT X - RAY WAVELENGTHS . J ...
Contents
Microscopic Identification of Electronic | 37 |
Thin Films The Relationship of Structure | 79 |
Symposium | 103 |
5 other sections not shown
Common terms and phrases
a-Si absorption alloy amorphous silicon analysis applications April 16 AT&T Bell Laboratories atoms Auger band gap Berkeley carrier characterization chemical composition concentration crystal crystalline deep levels defects density deposition depth profiling determined developed devices diffraction diffusion discussed disk donor dopant doped dose effects electrical electron microscopy energy epitaxial etching experimental formation function GaAs grain hydrogen impurities interface investigated Invited talk ion beam ion implantation Japan laser layers magnetic Materials Research measurements metal microstructure Murray Hill National Laboratory nitride observed obtained optical oxide oxygen Palo Alto parameters photoconductivity Physics polymer properties rapid thermal annealing Research Center Research Laboratory resonance Rutherford backscattering samples Sandia National Laboratories scanning Schottky secondary ion semiconductors SESSION silicide SIMS soft x-ray solar cells spectra spectrometry spectroscopy sputtering Stanford structure substrate surface synchrotron radiation technique Technology temperature thickness thin films transmission electron microscopy wafers Yorktown Heights