Treatise on Materials Science and Technology, Volume 19Herbert Herman |
Contents
vii | 63 |
The Use of Mössbauer Spectroscopy | 107 |
Instrumentation | 114 |
Copyright | |
10 other sections not shown
Common terms and phrases
absorption acceptor alloy angle Appl bandgap beam binding energies Bragg angle Bragg's Law broadening function Cavenett components composition profile cooling copper cryostat Cu-Ni Cu-Pd Dahlgren deposits detector determined diffractometer diffusion coefficients dislocation donor dye laser effective volume electron emission excess carrier excitation exciton experimental factor film GaAs heat Houska hyperfine field implantation impurities intensity bands interaction iron atoms isomer shift lattice parameter layer Lett linear luminescence magnetic martensite measurements Metals method Monemar Mössbauer spectra Mössbauer spectroscopy neighbor observed obtained optical cross sections peak phase photoluminescence photon PHOTON ENERGY Phys PL spectra powders range recombination region residual stress ribbon rocking curve sample semiconductors shown sin² single crystal solid Solid State Electron specimen spectrum sputter deposition sputtering steel structure studies subgrain substrate surface target techniques thermal thickness tilt vacuum variation velocity x-ray diffraction