Treatise on Materials Science and Technology, Volume 4 |
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Page 2
In addition , it is of great importance technologically to determine how these
properties change during the nucleation , growth ... The composition of thin films ,
especially alloys and mixtures , can be determined by characteristic X - ray
analysis .
In addition , it is of great importance technologically to determine how these
properties change during the nucleation , growth ... The composition of thin films ,
especially alloys and mixtures , can be determined by characteristic X - ray
analysis .
Page 12
The camera constant is usually determined from a polycrystalline standard
material where the dnki are known and the diffraction ring radii rhki are measured
. Typical calibrating materials are TICI , Au . and Al films as well as MgO “ smoke .
The camera constant is usually determined from a polycrystalline standard
material where the dnki are known and the diffraction ring radii rhki are measured
. Typical calibrating materials are TICI , Au . and Al films as well as MgO “ smoke .
Page 53
The accuracy of the integral breadth method for determining the particle size of
thin films has been verified for the case where all the diffracting crystallites had
the same particle size . Atasagun and Vook ( 1970 ) , using integral breadth ...
The accuracy of the integral breadth method for determining the particle size of
thin films has been verified for the case where all the diffracting crystallites had
the same particle size . Atasagun and Vook ( 1970 ) , using integral breadth ...
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Contents
RICHARD W VOOK | 2 |
Epitaxial Monocrystalline Films | 10 |
Polycrystalline Films | 37 |
Copyright | |
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Common terms and phrases
activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume X-ray yield