Treatise on Materials Science and Technology, Volume 4 |
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Page 2
Probably the most important methods for studying the microstructure of thin films
involve high energy electron and X - ray diffraction together with their microscopy
counterparts , transmission electron microscopy ( TEM ) and X - ray topography .
Probably the most important methods for studying the microstructure of thin films
involve high energy electron and X - ray diffraction together with their microscopy
counterparts , transmission electron microscopy ( TEM ) and X - ray topography .
Page 4
This theory is reasonably successful in explaining the gross features of XRD ,
HEED , and transmission electron ... For electrons , the truly quantitative (
dynamic ) theory , however , is based upon a quantum mechanical solution of the
motion of ...
This theory is reasonably successful in explaining the gross features of XRD ,
HEED , and transmission electron ... For electrons , the truly quantitative (
dynamic ) theory , however , is based upon a quantum mechanical solution of the
motion of ...
Page 11
B . Transmission Electron Diffraction 1 . SIMPLE KINEMATIC THEORY
Transmission high energy electron diffraction and transmission electron
microscopy , discussed in the next section , are the most commonly used
techniques for ...
B . Transmission Electron Diffraction 1 . SIMPLE KINEMATIC THEORY
Transmission high energy electron diffraction and transmission electron
microscopy , discussed in the next section , are the most commonly used
techniques for ...
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Contents
RICHARD W VOOK | 2 |
Epitaxial Monocrystalline Films | 10 |
Polycrystalline Films | 37 |
Copyright | |
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activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume X-ray yield