## Treatise on Materials Science and Technology, Volume 4 |

### From inside the book

Results 1-3 of 30

Page 90

47 ° 27 " ( 61 ) If one considers the factors 198 to be

47 ° 27 " ( 61 ) If one considers the factors 198 to be

**elements**of an N * N matrix , T ;, then Eq . ( 61 ) may be written as T ; +1 = T ; Ti , and ...Page 93

If one calls this product R with

If one calls this product R with

**elements**Ra = TC ,, then the influence of the correlation factor is immediately apparent since D = } 62 [ Cf = Rf The ...Page 94

Consider a column vector with 119

Consider a column vector with 119

**elements**. This vector denoted Pn gives the occupation probability of the various configurations after n vacancy jumps .### What people are saying - Write a review

We haven't found any reviews in the usual places.

### Contents

RICHARD W VOOK | 2 |

Epitaxial Monocrystalline Films | 10 |

Polycrystalline Films | 37 |

Copyright | |

6 other sections not shown

### Other editions - View all

### Common terms and phrases

activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent specimen strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume yield