## Treatise on Materials Science and Technology, Volume 4 |

### From inside the book

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Page 19

Generally , the transmitted beam is magnified ( bright

Generally , the transmitted beam is magnified ( bright

**field**operation ) , but dark**field**techniques using scattered electrons are also employed .Page 105

To introduce these factors into the flux , one must start with the probability for the first jump to be parallel or antiparallel to the

To introduce these factors into the flux , one must start with the probability for the first jump to be parallel or antiparallel to the

**field**which is ...Page 108

The influence of the applied

The influence of the applied

**field**will yield a linear force term in the random walk matrix , A , which was used to calculate T. Another linear force term ...### What people are saying - Write a review

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### Contents

RICHARD W VOOK | 2 |

Epitaxial Monocrystalline Films | 10 |

Polycrystalline Films | 37 |

Copyright | |

6 other sections not shown

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### Common terms and phrases

activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent specimen strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume yield