## Treatise on Materials Science and Technology, Volume 4 |

### From inside the book

Results 1-3 of 42

Page 7

2 ) having coordinates 5 , n , and lying on the Ewald sphere

2 ) having coordinates 5 , n , and lying on the Ewald sphere

**gives**the elastically scattered intensity in the direction k for the given incident electron ...Page 302

Likewise the applied stress 01 , with o2 = 03 = 0 , substituted in Eq . ( 17 ) ,

Likewise the applied stress 01 , with o2 = 03 = 0 , substituted in Eq . ( 17 ) ,

**gives**01 = f , which is the yield stress of the material , Y ( ) .Page 313

This

This

**gives**Do / Dp = exp [ -1/2 - EH + 2C ) ] ( 42 ) Substituting into Eq . ( 40 )**gives**H / Dp = ( H / D . ) po exp ( -3/2 ( - EH + 2C ) ] ( 43 ) ...### What people are saying - Write a review

We haven't found any reviews in the usual places.

### Contents

RICHARD W VOOK | 2 |

Epitaxial Monocrystalline Films | 10 |

Polycrystalline Films | 37 |

Copyright | |

6 other sections not shown

### Other editions - View all

### Common terms and phrases

activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent specimen strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume yield