Treatise on Materials Science and Technology, Volume 4 |
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Page 2
It is thus the aim of this chapter to consider the more important methods used in
the microstructural characterization of thin films . Generally , emphasis will be
given to those techniques which are usually readily available in most research
and ...
It is thus the aim of this chapter to consider the more important methods used in
the microstructural characterization of thin films . Generally , emphasis will be
given to those techniques which are usually readily available in most research
and ...
Page 52
Three methods are most commonly used for making the line broadening analysis
; variance , integral breadth , and Fourier ... In principle the Fourier analysis or
Warren - Averbach ( 1950 , 1952 ) method is the most accurate since the whole ...
Three methods are most commonly used for making the line broadening analysis
; variance , integral breadth , and Fourier ... In principle the Fourier analysis or
Warren - Averbach ( 1950 , 1952 ) method is the most accurate since the whole ...
Page 117
Stacking fault energy is a measurable parameter which is used to characterize
the nature of dislocations in an alloy . y has commonly been determined
experimentally by one of the following methods ( Christian and Swann , 1965 ) : (
1 ) Tu ...
Stacking fault energy is a measurable parameter which is used to characterize
the nature of dislocations in an alloy . y has commonly been determined
experimentally by one of the following methods ( Christian and Swann , 1965 ) : (
1 ) Tu ...
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Contents
RICHARD W VOOK | 2 |
Epitaxial Monocrystalline Films | 10 |
Polycrystalline Films | 37 |
Copyright | |
2 other sections not shown
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Common terms and phrases
activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume X-ray yield