## Treatise on Materials Science and Technology, Volume 4 |

### From inside the book

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Page 2

It is thus the aim of this chapter to consider the more important

the microstructural characterization of thin films . Generally , emphasis will be

given to those techniques which are usually readily available in most research

and ...

It is thus the aim of this chapter to consider the more important

**methods**used inthe microstructural characterization of thin films . Generally , emphasis will be

given to those techniques which are usually readily available in most research

and ...

Page 52

Three

; variance , integral breadth , and Fourier ... In principle the Fourier analysis or

Warren - Averbach ( 1950 , 1952 )

Three

**methods**are most commonly used for making the line broadening analysis; variance , integral breadth , and Fourier ... In principle the Fourier analysis or

Warren - Averbach ( 1950 , 1952 )

**method**is the most accurate since the whole ...Page 117

Stacking fault energy is a measurable parameter which is used to characterize

the nature of dislocations in an alloy . y has commonly been determined

experimentally by one of the following

1 ) Tu ...

Stacking fault energy is a measurable parameter which is used to characterize

the nature of dislocations in an alloy . y has commonly been determined

experimentally by one of the following

**methods**( Christian and Swann , 1965 ) : (1 ) Tu ...

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### Contents

RICHARD W VOOK | 2 |

Epitaxial Monocrystalline Films | 10 |

Polycrystalline Films | 37 |

Copyright | |

2 other sections not shown

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### Common terms and phrases

activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume X-ray yield