Treatise on Materials Science and Technology, Volume 4 |
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Page 50
X - ray diffraction information can be obtained from three sources : the diffraction
line peak positions , their line profiles , and their integrated intensities . The latter
quantity is essentially the total energy diffracted as the crystalline film is rotated ...
X - ray diffraction information can be obtained from three sources : the diffraction
line peak positions , their line profiles , and their integrated intensities . The latter
quantity is essentially the total energy diffracted as the crystalline film is rotated ...
Page 51
DIFFRACTION LINE PEAK SHIFT ANALYSES The general methods for
determining lattice parameters of polycrystalline films using extrapolation function
techniques and least squares methods are discussed by Cullity ( 1956 ) . The aim
of the ...
DIFFRACTION LINE PEAK SHIFT ANALYSES The general methods for
determining lattice parameters of polycrystalline films using extrapolation function
techniques and least squares methods are discussed by Cullity ( 1956 ) . The aim
of the ...
Page 52
The advantage of the integral breadth method is mainly due to the ease with
which it can be applied . The integral breadth B of a diffraction line is the ratio of
the area under the line ( above background ) divided by the peak intensity at the
...
The advantage of the integral breadth method is mainly due to the ease with
which it can be applied . The integral breadth B of a diffraction line is the ratio of
the area under the line ( above background ) divided by the peak intensity at the
...
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Contents
RICHARD W VOOK | 2 |
Epitaxial Monocrystalline Films | 10 |
Polycrystalline Films | 37 |
Copyright | |
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Common terms and phrases
activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations volume X-ray yield