## Treatise on Materials Science and Technology, Volume 4 |

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Page 5

Similarly , planes ( uvw ) in reciprocal

Similarly , planes ( uvw ) in reciprocal

**space**are represented by the uvw point in real**space**located at r ( uvw ) . Again r ( uvw ) | = 1 / d * ( uvw ) , where d * ( uvw ) is the interplanar spacing of the ( uvw ) planes in the ...Page 6

**space**. It is extremely convenient to represent the scattered intensity distribution as a point function in the reciprocal lattice . Thus if g , n , and $ are continuous position variables in this lattice , the scattered intensity JE ...Page 7

As a result , the radius of the Ewald sphere ( 1/2 ) is so large that to a very good approximation , the sphere can be considered to be a plane in the region near the origin of reciprocal

As a result , the radius of the Ewald sphere ( 1/2 ) is so large that to a very good approximation , the sphere can be considered to be a plane in the region near the origin of reciprocal

**space**. Thus a HEED pattern closely represents a ...### What people are saying - Write a review

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### Contents

RICHARD W VOOK | 2 |

Epitaxial Monocrystalline Films | 10 |

Polycrystalline Films | 37 |

Copyright | |

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activity addition alloys applied approximation average beam becomes calculated compaction component composition compression concentration considered constant copper correlation corresponding crystal cubic curve decreases defined deformation density dependence determined diffraction diffusion direction discussed dislocation disorder distribution effect electron elements energy enthalpy entropy equations example experimental expression factor fault field Figure forged function given gives increases influence interaction jump lattice material measurements mechanism metal method neighbor observed obtained occurs oriented parameter partial pattern phases Phys plane polycrystalline position possible powder present probability production properties random ratio reflections region relative respectively shown in Fig shows single crystals sintered solid solution solute atoms solvent specimen strain strengthening stress structure Substituting surface Table temperature theoretical theory thermodynamic thin films tracer twin vacancy values variations X-ray yield