## Treatise on materials science and technology, Volume 4 |

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### Contents

Microstructural Characterization of Thin Films | 2 |

Fundamental Concepts of Diffraction | 4 |

Epitaxial Monocrystalline Films | 10 |

Copyright | |

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a-sublattice Acta alloys aluminum average beam calculated compaction component compositional dependences compression concentration configurational entropy copper correlation factor crystallites CsCl phases decreases deformation diffraction pattern diffusion coefficient dislocation density disorder parameter effect electron diffraction equations Evans and Flanagan f.c. tetragonal face-centered cubic fiber axis flux forged free energy function Gibbs free energy given increases intermetallic iron powder isostatic jump rate lattice disorder material matrix mechanism nearest neighbor observed obtained occurs oriented partial enthalpy partial entropy Phys plane Poisson ratio polycrystalline probability pure metals random reciprocal lattice relps RHEED shear stress shown in Fig single crystals sintered sintered powder solid solution strengthening solute atoms solute content specimen stacking fault energy stoichiometry stress-strain curve structure sublattice Substituting surface Suzuki TED pattern temperature dependence tetragonal theoretical thermal thermodynamic thermodynamic activities thermodynamic properties thin films tracer jump twin vacancy jumps values variations Vook X-ray yield stress