X-RAY DIFFRACTION: ITS THEORY AND APPLICATIONSDesigned for the undergraduate and postgraduate students of physics, materials science and metallurgical engineering, this text explains the theory of X-ray diffraction starting from diffraction by an electron to that by an atom, a crystal, and finally ending with a diffraction by a conglomerate of atoms either in the single crystal or in the polycrystal stage. This Second Edition of the book includes a new chapter on Electron Diffraction as electron diffraction along with X-ray diffraction are complementary to each other and are also included in the curriculum. The book amply blends the theory with major applications of X-ray diffraction, including those of direct analysis of lattice defects by X-ray topography, orientation texture analysis, chemical analysis by diffraction as well as by fluorescence. KEY FEATURES : Set of numerical problems along with solutions Details of some different experimental techniques Unsolved problems and Review Questions to grasp the concepts. |
Contents
2 | |
Ch02pdf | 22 |
Ch03pdf | 29 |
Ch04pdf | 49 |
Ch05pdf | 69 |
Ch06pdf | 108 |
Ch07pdf | 116 |
Ch08pdf | 130 |
Ch11pdf | 146 |
Ch12pdf | 154 |
Ch13pdf | 159 |
Ch14pdf | 166 |
Ch15pdf | 176 |
Epiloguepdf | 193 |
Appendixpdf | 195 |
209 | |
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Common terms and phrases
alloy amorphous solids amplitude analysis atomic number atoms axes axis Bragg angle Bragg’s Bragg's law Bravais lattices broadening camera centre Crystal system crystalline crystallites cubic curve Debye determination diffracted beam diffraction pattern diffraction profile diffractometer distance domain effect electron beam electron density electron microscope energy equation experimental expression fault Fhkl fibre film fluorescence Fourier series function Gaussian Gaussian function given incident integral breadth intensity known lattice parameter layer lens Lorentzian measured method monochromatic orientation orthorhombic particle Patterson Patterson function Patterson peaks peak perpendicular phase photographic plane plot pole figure polycrystalline position powder radiation reciprocal lattice reciprocal space reflection residual stress rotation sample sin2 single crystal small angle scattering specimen spots strain structure factor surface target technique temperature texture transmission unit cell values vector wave wavelength X-ray beam X-ray diffraction