Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 11
... absorption coefficient , is the one usually tabulated . Equation ( 1-10 ) may then be rewritten in a more usable form : Iz = Ioe ( μ / p ) px ( 1-11 ) Values of the mass absorption coefficient μ / p are given in Appendix 4 for various ...
... absorption coefficient , is the one usually tabulated . Equation ( 1-10 ) may then be rewritten in a more usable form : Iz = Ioe ( μ / p ) px ( 1-11 ) Values of the mass absorption coefficient μ / p are given in Appendix 4 for various ...
Page 129
... Absorption in Debye - Scherrer specimens : ( a ) general case , ( b ) highly absorbing specimen . 4-10 Absorption factor . Still another factor affecting the intensities of the diffracted rays must be considered , and that is the absorption ...
... Absorption in Debye - Scherrer specimens : ( a ) general case , ( b ) highly absorbing specimen . 4-10 Absorption factor . Still another factor affecting the intensities of the diffracted rays must be considered , and that is the absorption ...
Page 427
... absorption edges occur at such long wavelengths that the incident radiation is almost completely absorbed even by very thin samples . ( However , the difficulties involved in preparing thin samples of solid materials may be avoided by ...
... absorption edges occur at such long wavelengths that the incident radiation is almost completely absorbed even by very thin samples . ( However , the difficulties involved in preparing thin samples of solid materials may be avoided by ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cos² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone