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Page 67
sired angle measurement can then be made . Figure 2–31 ( a ) is a projection of
the two poles P , and P2 shown in perspective in Fig . 2-26 , and the angle
between them is found by the rotation illustrated in Fig . 2-31 ( b ) . This rotation of
the ...
sired angle measurement can then be made . Figure 2–31 ( a ) is a projection of
the two poles P , and P2 shown in perspective in Fig . 2-26 , and the angle
between them is found by the rotation illustrated in Fig . 2-31 ( b ) . This rotation of
the ...
Page 98
When we consider incident rays that make Bragg angles only slightly different
from 08 , we find that destructive interference is not complete . Ray B , for
example , makes a slightly larger angle 01 , such that ray L ' from the mth plane
below the ...
When we consider incident rays that make Bragg angles only slightly different
from 08 , we find that destructive interference is not complete . Ray B , for
example , makes a slightly larger angle 01 , such that ray L ' from the mth plane
below the ...
Page 247
CN is the normal to the reflecting plane . that the normal to a particular set of
reflecting lattice planes describes a small cone of apex angle 2e ; i.e. , in various
parts of the crystal the normal deviates by an angle e in all directions from its
mean ...
CN is the normal to the reflecting plane . that the normal to a particular set of
reflecting lattice planes describes a small cone of apex angle 2e ; i.e. , in various
parts of the crystal the normal deviates by an angle e in all directions from its
mean ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |