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Page 104
That this must be so may be seen by considering the two structures shown in Fig .
4-1 . Both are orthorhombic with two atoms ... Consider reflections from the ( 001 )
planes which are shown in profile in Fig . 4-2 . For the base - centered lattice ...
That this must be so may be seen by considering the two structures shown in Fig .
4-1 . Both are orthorhombic with two atoms ... Consider reflections from the ( 001 )
planes which are shown in profile in Fig . 4-2 . For the base - centered lattice ...
Page 124
Consider the 100 reflection from a cubic lattice . In the powder specimen , some
of the crystals will be so oriented that reflection can occur from their ( 100 ) planes
. Other crystals of different orientation may be in such a position that reflection ...
Consider the 100 reflection from a cubic lattice . In the powder specimen , some
of the crystals will be so oriented that reflection can occur from their ( 100 ) planes
. Other crystals of different orientation may be in such a position that reflection ...
Page 366
For example , consider 100 atoms of AuCuz , i.e. , 25 gold atoms and 75 copper
atoms . Suppose the ordering is ... Then , considering the gold atom as the A
atom in Eq . ( 13-2 ) , we find that TA z = 0.88 and FA = 0.25 . Therefore , 0.88
0.25 S ...
For example , consider 100 atoms of AuCuz , i.e. , 25 gold atoms and 75 copper
atoms . Suppose the ordering is ... Then , considering the gold atom as the A
atom in Eq . ( 13-2 ) , we find that TA z = 0.88 and FA = 0.25 . Therefore , 0.88
0.25 S ...
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Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |