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Page 110
The actual calculation of f 20 involves sin a rather than 0 , so that the net effect is
that s decreases as fou the quantity ( sin 6 ) / increases . Calculated values of f for
various 10+ atoms and various values of ( sin 6 ) / are tabulated in Appendix 8 ...
The actual calculation of f 20 involves sin a rather than 0 , so that the net effect is
that s decreases as fou the quantity ( sin 6 ) / increases . Calculated values of f for
various 10+ atoms and various values of ( sin 6 ) / are tabulated in Appendix 8 ...
Page 130
high - 8 and low - A reflections decreases as the linear absorption coefficient of
the specimen decreases , but the absorption is always greater for the low - 4
reflections . ( These remarks apply only to the cylindrical specimen used in the
Debye ...
high - 8 and low - A reflections decreases as the linear absorption coefficient of
the specimen decreases , but the absorption is always greater for the low - 4
reflections . ( These remarks apply only to the cylindrical specimen used in the
Debye ...
Page 196
decreases more slowly to its normal value . All pulses have the same ... This
decrease in pulse height with decrease in pulse spacing has been correlated
with the phenomena occurring in the counter as follows . When the avalanche of
...
decreases more slowly to its normal value . All pulses have the same ... This
decrease in pulse height with decrease in pulse spacing has been correlated
with the phenomena occurring in the counter as follows . When the avalanche of
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |