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Page 200
The absorption efficiency depends on the absorption coefficient and thickness of
the counter window , both of which should be as small as possible , and on the
absorption coefficient of the counter gas and the length of the counter , both of ...
The absorption efficiency depends on the absorption coefficient and thickness of
the counter window , both of which should be as small as possible , and on the
absorption coefficient of the counter gas and the length of the counter , both of ...
Page 388
The lattice parameter of a binary solid solution of B in A depends only on the
percentage of B in the alloy , as long as the solution is unsaturated . This fact can
be made the basis for chemical analysis by parameter measurement . All that is ...
The lattice parameter of a binary solid solution of B in A depends only on the
percentage of B in the alloy , as long as the solution is unsaturated . This fact can
be made the basis for chemical analysis by parameter measurement . All that is ...
Page 412
15–4 ) , the value of B depends partly on the collimation of the beam striking the
crystal and partly on the perfection of the crystal itself . The beam reflected by the
crystal into the counter is fairly wide , in a linear sense , but almost parallel ; its ...
15–4 ) , the value of B depends partly on the collimation of the beam striking the
crystal and partly on the perfection of the crystal itself . The beam reflected by the
crystal into the counter is fairly wide , in a linear sense , but almost parallel ; its ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |