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Page 317
the shape and size of the unit cell is to find the number of atoms in that cell ,
because the number of atoms must be known before their positions can be
determined . To find this number we use the fact that the volume of the unit cell ,
calculated ...
the shape and size of the unit cell is to find the number of atoms in that cell ,
because the number of atoms must be known before their positions can be
determined . To find this number we use the fact that the volume of the unit cell ,
calculated ...
Page 324
In the main , these applications involve solid solutions ; since the lattice
parameter of a solid solution varies with the concentration of the solute , the
composition of a given solution can be determined from a measurement of its
lattice parameter ...
In the main , these applications involve solid solutions ; since the lattice
parameter of a solid solution varies with the concentration of the solute , the
composition of a given solution can be determined from a measurement of its
lattice parameter ...
Page 345
CHAPTER 12 PHASE - DIAGRAM DETERMINATION 12–1 Introduction . An alloy
is a combination of two or more ... microscopic examination , and many diagrams
have been determined by these means alone . X - ray diffraction , however ...
CHAPTER 12 PHASE - DIAGRAM DETERMINATION 12–1 Introduction . An alloy
is a combination of two or more ... microscopic examination , and many diagrams
have been determined by these means alone . X - ray diffraction , however ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray