Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 317
... determined . To find this number we use the fact that the volume of the unit cell , calculated from the lattice ... DETERMINATION OF ATOM POSITIONS Determination of atom positions.
... determined . To find this number we use the fact that the volume of the unit cell , calculated from the lattice ... DETERMINATION OF ATOM POSITIONS Determination of atom positions.
Page 345
... determined by these means alone . X - ray diffraction , however , supplements these older techniques in many useful ways and provides , in addition , the only means of determining the crystal structures of the various phases involved ...
... determined by these means alone . X - ray diffraction , however , supplements these older techniques in many useful ways and provides , in addition , the only means of determining the crystal structures of the various phases involved ...
Page 361
... determined by quench- ing single - phase alloys from an elevated temperature , is found to be linear , the parameter varying from 3.6060A for pure A to 3.6140A in a containing 4.0 weight . percent B. The solvus curve is to be determined ...
... determined by quench- ing single - phase alloys from an elevated temperature , is found to be linear , the parameter varying from 3.6060A for pure A to 3.6140A in a containing 4.0 weight . percent B. The solvus curve is to be determined ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cosĀ² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone