## Elements of X-ray diffraction |

### From inside the book

Results 1-3 of 87

Page 37

2-6 Lattice

described by first drawing a line through the origin parallel to the given line and

then giving the coordinates of any point on the line through the origin. Let the line

pass through the origin of the unit cell and any point having coordinates u v w,

where these numbers are not necessarily integral. (This line will also pass

through the points 2m 2v 2w, 3u 3v 3ui, etc.) Then [uvw], written in square

brackets, are the ...

2-6 Lattice

**directions**and planes. The**direction**of any line in a lattice may bedescribed by first drawing a line through the origin parallel to the given line and

then giving the coordinates of any point on the line through the origin. Let the line

pass through the origin of the unit cell and any point having coordinates u v w,

where these numbers are not necessarily integral. (This line will also pass

through the points 2m 2v 2w, 3u 3v 3ui, etc.) Then [uvw], written in square

brackets, are the ...

Page 82

the path difference for rays 1KV and 2L2' is ML + LN = d' sin 6 + d' sin B. This is

also the path difference for the overlapping rays scattered by S and P in the

scattered by S and L or P and K. Scattered rays 1' and 2' will be completely in

phase if this path difference is equal to a whole number n of wavelengths, or if ,- "

—* N ( n\ = 2d' sin 6.) (3-1) This relation was first formulated by W. L. Bragg and is

known as ...

the path difference for rays 1KV and 2L2' is ML + LN = d' sin 6 + d' sin B. This is

also the path difference for the overlapping rays scattered by S and P in the

**direction**shown, since in this**direction**there is no path difference between raysscattered by S and L or P and K. Scattered rays 1' and 2' will be completely in

phase if this path difference is equal to a whole number n of wavelengths, or if ,- "

—* N ( n\ = 2d' sin 6.) (3-1) This relation was first formulated by W. L. Bragg and is

known as ...

Page 280

In materials having a fiber texture, the individual grains have a common

crystallographic

rotational position about that axis. It follows that the diffraction pattern of such

materials will have continuous Debye rings if the incident x-ray beam is parallel

to the fiber axis. However, the relative intensities of these rings will not be the

same as those calculated for a specimen containing randomly oriented grains.

Therefore, continuous ...

In materials having a fiber texture, the individual grains have a common

crystallographic

**direction**parallel to the fiber axis but they can have anyrotational position about that axis. It follows that the diffraction pattern of such

materials will have continuous Debye rings if the incident x-ray beam is parallel

to the fiber axis. However, the relative intensities of these rings will not be the

same as those calculated for a specimen containing randomly oriented grains.

Therefore, continuous ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

Properties of Xrays | 1 |

The Geometry of Crystals | 29 |

The Directions of Diffracted Beams | 78 |

Copyright | |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone