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Page 154
The pattern is symmetrical on either side , and the value of a particular reflection
is obtained by measuring U , the distance apart of two diffraction lines formed by
the same cone of radiation , and using the relation 40R = U. Photographic film ...
The pattern is symmetrical on either side , and the value of a particular reflection
is obtained by measuring U , the distance apart of two diffraction lines formed by
the same cone of radiation , and using the relation 40R = U. Photographic film ...
Page 228
PROJECTION N I film cut corner E TITOTTT 654 32 1 0 2 3 distance PQ distance
OS S Fig . 8-11 . Use of a stereographic ruler to plot the pole of a reflecting plane
on a stereographic projection in the back - reflection Laue method . Pole l ' is ...
PROJECTION N I film cut corner E TITOTTT 654 32 1 0 2 3 distance PQ distance
OS S Fig . 8-11 . Use of a stereographic ruler to plot the pole of a reflecting plane
on a stereographic projection in the back - reflection Laue method . Pole l ' is ...
Page 440
K is known as the stress factor , and it can be calculated once and for all for a
given specimen , radiation , and specimen - to - film distance . To ensure that the
specimen - tofilm distance D is effectively equal for both the inclined- and normal
...
K is known as the stress factor , and it can be calculated once and for all for a
given specimen , radiation , and specimen - to - film distance . To ensure that the
specimen - tofilm distance D is effectively equal for both the inclined- and normal
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |