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Page 204
The probable error * in a single count of N pulses , relative to an average value
obtained by a great many repetitions of the ... For some of the total counts
obtainable from a binary scaler , this expression gives the following errors : Total
number ...
The probable error * in a single count of N pulses , relative to an average value
obtained by a great many repetitions of the ... For some of the total counts
obtainable from a binary scaler , this expression gives the following errors : Total
number ...
Page 325
Bernard Dennis Cullity. of sin 8 can be obtained from a measurement of 0 which
is itself not particularly precise , provided that is near 90 ° . At 6 = 85 ° , for
example , a 1 percent error in ...
Bernard Dennis Cullity. of sin 8 can be obtained from a measurement of 0 which
is itself not particularly precise , provided that is near 90 ° . At 6 = 85 ° , for
example , a 1 percent error in ...
Page 334
Thus , the experimenter has no automatic check on the accuracy of the angular
scale of the instrument or the precision of its alignment . When a diffractometer is
used to measure plane spacings , the more important sources of systematic error
...
Thus , the experimenter has no automatic check on the accuracy of the angular
scale of the instrument or the precision of its alignment . When a diffractometer is
used to measure plane spacings , the more important sources of systematic error
...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |