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Page 123
Bernard Dennis Cullity. It is by these missing reflections , such as 11.1 , 11.3 , 22-
1 , 22-3 , that a hexagonal structure is recognized as being close - packed . Not
all the reflections present have the same structure factor . For example , if ( h + 2k
) ...
Bernard Dennis Cullity. It is by these missing reflections , such as 11.1 , 11.3 , 22-
1 , 22-3 , that a hexagonal structure is recognized as being close - packed . Not
all the reflections present have the same structure factor . For example , if ( h + 2k
) ...
Page 128
Intersection of cones of diffracted rays with Debye - Scherrer film . thus leads to a
third geometrical factor affecting the intensity of a reflection . The length of any
diffraction line being 2R sin 20B , where R is the radius of the camera , the
relative ...
Intersection of cones of diffracted rays with Debye - Scherrer film . thus leads to a
third geometrical factor affecting the intensity of a reflection . The length of any
diffraction line being 2R sin 20B , where R is the radius of the camera , the
relative ...
Page 132
In arriving at this equation , we have omitted factors which are constant for all
lines of the pattern . For example , all that is retained of the Thomson equation (
Eq . 4-2 ) is the polarization factor ( 1 + cos2 20 ) , with constant factors , such as
the ...
In arriving at this equation , we have omitted factors which are constant for all
lines of the pattern . For example , all that is retained of the Thomson equation (
Eq . 4-2 ) is the polarization factor ( 1 + cos2 20 ) , with constant factors , such as
the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |