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Page 154
6-4 Film loading . Figure 6-5 illustrates three methods of arranging the film strip in
the Debye method . The small sketches on the right show the loaded film in
relation to the incident beam , while the films laid out flat are indicated on the left .
6-4 Film loading . Figure 6-5 illustrates three methods of arranging the film strip in
the Debye method . The small sketches on the right show the loaded film in
relation to the incident beam , while the films laid out flat are indicated on the left .
Page 216
Intersection of a conical array of diffracted beams with a film placed in the back -
reflection position . C = crystal , F film , Z.A. = zone axis . mount sheet or plate
specimens with their plane parallel to the plane of the film and one edge of the
sheet ...
Intersection of a conical array of diffracted beams with a film placed in the back -
reflection position . C = crystal , F film , Z.A. = zone axis . mount sheet or plate
specimens with their plane parallel to the plane of the film and one edge of the
sheet ...
Page 218
where OC = D specimen - film distance . The angles u and o are obtained from y
and 8 as follows : EN CF tan tan tan M FO CF siny sin y ON tan o = OC ( F ( Mcco
) - Chitan 9 ) ( chicos tan 8 sin u COS Y Ύ With these equations , the position ( in
...
where OC = D specimen - film distance . The angles u and o are obtained from y
and 8 as follows : EN CF tan tan tan M FO CF siny sin y ON tan o = OC ( F ( Mcco
) - Chitan 9 ) ( chicos tan 8 sin u COS Y Ύ With these equations , the position ( in
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |