## Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |

### From inside the book

Results 1-3 of 22

Page 132

(4–12) sin” 0 cos 6 where I = relative

structure factor, p = multiplicity factor, and 6 = Bragg angle. In arriving at this

equation, we have omitted factors which are constant for all lines of the pattern.

(4–12) sin” 0 cos 6 where I = relative

**integrated intensity**(arbitrary units), F =structure factor, p = multiplicity factor, and 6 = Bragg angle. In arriving at this

equation, we have omitted factors which are constant for all lines of the pattern.

Page 187

But if line intensities are to be compared over the whole range of 20, the same

divergence must be used throughout ... On the other hand, the relative

its ...

But if line intensities are to be compared over the whole range of 20, the same

divergence must be used throughout ... On the other hand, the relative

**integrated****intensity**of a diffraction line is independent of slit width, which is one reason forits ...

Page 205

Three other methods of measuring

which utilize the integrating properties of ... the scaler, minus the number of

counts due to the background, is then proportional to the

the line.

Three other methods of measuring

**integrated intensities**have been used, all ofwhich utilize the integrating properties of ... the scaler, minus the number of

counts due to the background, is then proportional to the

**integrated intensity**ofthe line.

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYs | 1 |

THE GEOMETRY OF CRYSTALs | 29 |

27 | 36 |

Copyright | |

29 other sections not shown

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### Common terms and phrases

absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated chart circle composition constant copper counter counting rate cubic curve Debye ring decreases density determined diffracted beam diffraction lines diffraction pattern diffraction spot diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent radiation focusing Geiger counter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method Laue spots martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen stress structure substance surface temperature tetragonal thickness tion transmission twin unit cell vector voltage wavelength x-ray beam x-ray diffraction x-ray method x-ray tube zone