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Page 80
Two conclusions may be drawn from this illustration : ( 1 ) Differences in the
length of the path traveled lead to differences in phase . ( 2 ) The introduction of
phase differences produces a change in amplitude . The greater the path
difference ...
Two conclusions may be drawn from this illustration : ( 1 ) Differences in the
length of the path traveled lead to differences in phase . ( 2 ) The introduction of
phase differences produces a change in amplitude . The greater the path
difference ...
Page 126
Let a equal the atom spacing in the plane and Na the total length * of the plane .
The difference in path length for rays 1 ' and 2 scattered by adjacent atoms is
given by 01'2 ' AD – CB = a cos 02 a cos 01 = a [ cos ( OB – 40 ) – cos ( 68 + 10 ) ]
.
Let a equal the atom spacing in the plane and Na the total length * of the plane .
The difference in path length for rays 1 ' and 2 scattered by adjacent atoms is
given by 01'2 ' AD – CB = a cos 02 a cos 01 = a [ cos ( OB – 40 ) – cos ( 68 + 10 ) ]
.
Page 158
Line positions are measured on each film , as well as the total length of the film
between the knife - edge shadows M and N. Because of variable film shrinkage ,
these films will generally have unequal lengths . The length of one is taken as a ...
Line positions are measured on each film , as well as the total length of the film
between the knife - edge shadows M and N. Because of variable film shrinkage ,
these films will generally have unequal lengths . The length of one is taken as a ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |