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Results 1-3 of 73
Page 205
Suppose a measurement is required of the diffraction background , always rather
low , in the presence of a fairly large ... Then No counts are due to the
unavoidable background and ( N – Nb ) to the diffraction background being
measured ...
Suppose a measurement is required of the diffraction background , always rather
low , in the presence of a fairly large ... Then No counts are due to the
unavoidable background and ( N – Nb ) to the diffraction background being
measured ...
Page 446
In theory , different slit arrangements are therefore necessary for the
measurement made at y O and the one made at y 45 ° . In practice , a change in
slit position between each of these measurements is avoided by making a
compromise ...
In theory , different slit arrangements are therefore necessary for the
measurement made at y O and the one made at y 45 ° . In practice , a change in
slit position between each of these measurements is avoided by making a
compromise ...
Page 449
For the measurement of stress by x - rays we have developed two working
equations , Eqs . ( 17-14 ) and ( 17-15 ) ... The stress factor K contains the
quantity E / ( 1 + v ) , and we have tacitly assumed that the values of E and v
measured in the ...
For the measurement of stress by x - rays we have developed two working
equations , Eqs . ( 17-14 ) and ( 17-15 ) ... The stress factor K contains the
quantity E / ( 1 + v ) , and we have tacitly assumed that the values of E and v
measured in the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |