Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
From inside the book
Results 1-3 of 78
Page 205
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
Page 446
... measured to an accuracy of 0.02 ° , then the probable error in the stress measured is ± 2880 psi . - Essentially , the quantity measured in the diffractometer method is A20 = ( 20n - 20 ; ) , the shift in the diffraction line due to ...
... measured to an accuracy of 0.02 ° , then the probable error in the stress measured is ± 2880 psi . - Essentially , the quantity measured in the diffractometer method is A20 = ( 20n - 20 ; ) , the shift in the diffraction line due to ...
Page 449
... measured in the ordinary way during a tensile test are to be used in calculating the value of K. But these mechanically measured values are not necessarily the correct ones to apply to a diffraction measurement . In the latter , strains ...
... measured in the ordinary way during a tensile test are to be used in calculating the value of K. But these mechanically measured values are not necessarily the correct ones to apply to a diffraction measurement . In the latter , strains ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
24 other sections not shown
Other editions - View all
Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cos² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone