Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 133
... Obtained from Appendix 7. Needed to determine fcu Column 8 : Read from the curve of Fig . 4-6 . Column 9 : Obtained from the relation F2 Column 10 : Obtained from Appendix 9 . = 16fcu2 . Column 11 : Obtained from Appendix 10 . Column 12 ...
... Obtained from Appendix 7. Needed to determine fcu Column 8 : Read from the curve of Fig . 4-6 . Column 9 : Obtained from the relation F2 Column 10 : Obtained from Appendix 9 . = 16fcu2 . Column 11 : Obtained from Appendix 10 . Column 12 ...
Page 154
... obtained by measuring U , the distance apart of two diffraction lines formed by the same cone of radiation , and using the relation 40R = U. Photographic film always shrinks slightly during processing and drying , and this shrinkage ...
... obtained by measuring U , the distance apart of two diffraction lines formed by the same cone of radiation , and using the relation 40R = U. Photographic film always shrinks slightly during processing and drying , and this shrinkage ...
Page 382
... obtained with a Debye - Scherrer camera and Mo Ka radia- tion . Since a change in wavelength alters the relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be ...
... obtained with a Debye - Scherrer camera and Mo Ka radia- tion . Since a change in wavelength alters the relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cosĀ² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone