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Page 82
It states the essential condition which must be met if diffraction is to occur . n is
called the order of reflection ; it may take on any integral value consistent with sin
0 not exceeding unity and is equal to the number of wavelengths in the path ...
It states the essential condition which must be met if diffraction is to occur . n is
called the order of reflection ; it may take on any integral value consistent with sin
0 not exceeding unity and is equal to the number of wavelengths in the path ...
Page 112
If the Bragg law is not satisfied , no diffracted beam can occur ; however , the
Bragg law may be satisfied for a certain set of atomic planes and yet no diffraction
may occur , as in the example given at the beginning of this chapter , because of
a ...
If the Bragg law is not satisfied , no diffracted beam can occur ; however , the
Bragg law may be satisfied for a certain set of atomic planes and yet no diffraction
may occur , as in the example given at the beginning of this chapter , because of
a ...
Page 244
The normal forces have no effect , but the shearing forces cause slip to occur ,
and the crystal would , as a result , assume the shape shown in ( b ) if the ends
were not constrained laterally . However , the grips of the tensile machine keep
the ...
The normal forces have no effect , but the shearing forces cause slip to occur ,
and the crystal would , as a result , assume the shape shown in ( b ) if the ends
were not constrained laterally . However , the grips of the tensile machine keep
the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |