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Page 88
Similarly , any published table of wavelengths can be tested for the correctness of
its units by noting the wavelength given for a particular characteristic line , Cu Ka
, for example . The wavelength of this line is 1.54051A or 1.53740 kX .
Similarly , any published table of wavelengths can be tested for the correctness of
its units by noting the wavelength given for a particular characteristic line , Cu Ka
, for example . The wavelength of this line is 1.54051A or 1.53740 kX .
Page 127
However , in the powder method , a second geometrical factor arises when we
consider that the integrated intensity of a reflection at any particular Bragg angle
depends on the number of particles oriented at or near that angle . This number
is ...
However , in the powder method , a second geometrical factor arises when we
consider that the integrated intensity of a reflection at any particular Bragg angle
depends on the number of particles oriented at or near that angle . This number
is ...
Page 449
In the latter , strains are measured in particular crystallographic directions ,
namely , the directions normal to the ( hkl ) reflecting planes , and we know that
both E and v vary with crystallographic direction . This anisotropy of elastic
properties ...
In the latter , strains are measured in particular crystallographic directions ,
namely , the directions normal to the ( hkl ) reflecting planes , and we know that
both E and v vary with crystallographic direction . This anisotropy of elastic
properties ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |