Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 152
... pinhole system which collimates the incident beam is important , especially when weak dif- fracted beams must be recorded . The exit pinhole scatters x - rays in all di- rections , and these scattered rays , if not prevented from ...
... pinhole system which collimates the incident beam is important , especially when weak dif- fracted beams must be recorded . The exit pinhole scatters x - rays in all di- rections , and these scattered rays , if not prevented from ...
Page 163
... Pinhole photographs . When monochromatic radiation is used to examine a polycrystalline specimen in a Laue camera , the result is called , for no particularly good reason , a pinhole photograph ... PINHOLE PHOTOGRAPHS 6-9 Pinhole photographs.
... Pinhole photographs . When monochromatic radiation is used to examine a polycrystalline specimen in a Laue camera , the result is called , for no particularly good reason , a pinhole photograph ... PINHOLE PHOTOGRAPHS 6-9 Pinhole photographs.
Page 295
... pinhole photograph should not be over- looked . It is surprising how much information an experienced observer can obtain simply by inspection of a pinhole photograph , without any knowledge of the specimen , i.e. , without knowing its ...
... pinhole photograph should not be over- looked . It is surprising how much information an experienced observer can obtain simply by inspection of a pinhole photograph , without any knowledge of the specimen , i.e. , without knowing its ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cosĀ² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone