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Page 88
The wavelength of this line is 1.54051A or 1.53740 kX . 3-5 Diffraction directions .
What determines the possible directions , i.e. , the possible angles 20 , in which a
given crystal can diffract a beam of monochromatic x - rays ? Referring to Fig .
The wavelength of this line is 1.54051A or 1.53740 kX . 3-5 Diffraction directions .
What determines the possible directions , i.e. , the possible angles 20 , in which a
given crystal can diffract a beam of monochromatic x - rays ? Referring to Fig .
Page 272
We may wish to make the effective depth of penetration as large as possible in
some applications . Then a and B in Eq . ( 9-3 ) must be as large as possible ,
indicating the use of highangle lines , and u as small as possible , indicating
short ...
We may wish to make the effective depth of penetration as large as possible in
some applications . Then a and B in Eq . ( 9-3 ) must be as large as possible ,
indicating the use of highangle lines , and u as small as possible , indicating
short ...
Page 298
Since structure determines the diffraction pattern , it should be possible to go in
the other direction and deduce the structure from the pattern . It is possible , but
not in any direct manner . Given a structure , we can calculate its diffraction
pattern ...
Since structure determines the diffraction pattern , it should be possible to go in
the other direction and deduce the structure from the pattern . It is possible , but
not in any direct manner . Given a structure , we can calculate its diffraction
pattern ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |