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Results 1-3 of 82
Page 27
limit of the continuous spectrum emitted and the maximum energy per quantum of
radiation ? 1-3 . Graphically verify Moseley's law for the KB , lines of Cu , Mo , and
W. 14. Plot the ratio of transmitted to incident intensity vs. thickness of lead ...
limit of the continuous spectrum emitted and the maximum energy per quantum of
radiation ? 1-3 . Graphically verify Moseley's law for the KB , lines of Cu , Mo , and
W. 14. Plot the ratio of transmitted to incident intensity vs. thickness of lead ...
Page 166
The characteristic radiations usually employed in x - ray diffraction are the
following : Mo Ka : 0.711A Cu Ka : 1.542 Co Ka ... Fe Ka : 1.937 Cr Ka : 2.291 In
each case , the appropriate filter is used to suppress the KB component of the
radiation .
The characteristic radiations usually employed in x - ray diffraction are the
following : Mo Ka : 0.711A Cu Ka : 1.542 Co Ka ... Fe Ka : 1.937 Cr Ka : 2.291 In
each case , the appropriate filter is used to suppress the KB component of the
radiation .
Page 168
The purest kind of radiation to use in a diffraction experiment is radiation which
has itself been diffracted , since it is entirely monochromatic . * If a single crystal is
set to reflect the strong Ka component of the general radiation from an x - ray ...
The purest kind of radiation to use in a diffraction experiment is radiation which
has itself been diffracted , since it is entirely monochromatic . * If a single crystal is
set to reflect the strong Ka component of the general radiation from an x - ray ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |