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Page 227
film S T ( 90 ° -0 ) IN reference sphere D 45 ° r M 20 ( 90 ° —0 ) N ' projection
plane P R Fig . 8-10 . Relation between diffraction spot S and stereographic
projection P of the plane causing the spot , for back reflection . of Fig . 8-6 , a
coincidence ...
film S T ( 90 ° -0 ) IN reference sphere D 45 ° r M 20 ( 90 ° —0 ) N ' projection
plane P R Fig . 8-10 . Relation between diffraction spot S and stereographic
projection P of the plane causing the spot , for back reflection . of Fig . 8-6 , a
coincidence ...
Page 250
Suppose that , on the polished surface of a twinned grain , the trace of the
composition plane makes an angle a with some reference line NS , as shown in
Fig . 8-34 ( a ) . Then , if we make the projection plane parallel to the plane of
polish ...
Suppose that , on the polished surface of a twinned grain , the trace of the
composition plane makes an angle a with some reference line NS , as shown in
Fig . 8-34 ( a ) . Then , if we make the projection plane parallel to the plane of
polish ...
Page 439
line from reference material S , Z film Si 2 ' N2 Ni H line from specimen specimen
surface 0 B O ||| 2 Fig . 17–7 . Back - reflection method at inclined incidence .
measure only S1 , since the position of this side of the ring is more sensitive to ...
line from reference material S , Z film Si 2 ' N2 Ni H line from specimen specimen
surface 0 B O ||| 2 Fig . 17–7 . Back - reflection method at inclined incidence .
measure only S1 , since the position of this side of the ring is more sensitive to ...
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Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |