Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 202
... scaler is an electronic device which counts each pulse produced by the counter . Once the number of pulses over a ... scaler fulfills this latter function . There are two main kinds , the binary scaler , in which the scaling factor is ...
... scaler is an electronic device which counts each pulse produced by the counter . Once the number of pulses over a ... scaler fulfills this latter function . There are two main kinds , the binary scaler , in which the scaling factor is ...
Page 203
... scaler is started and stops at the instant a pulse is transmitted from the last stage . For example , if the timer is connected to a 10 - stage scaler , it will stop when exactly 1024 ( = 210 ) ... scaler are functioning 7-8 ] 203 SCALERS.
... scaler is started and stops at the instant a pulse is transmitted from the last stage . For example , if the timer is connected to a 10 - stage scaler , it will stop when exactly 1024 ( = 210 ) ... scaler are functioning 7-8 ] 203 SCALERS.
Page 206
... scaler is also put to use in x - ray tube moni- tors . In Sec . 7-2 it was mentioned that the incident - beam intensity had to be maintained absolutely constant in a diffractometer and that this constancy required tube current and ...
... scaler is also put to use in x - ray tube moni- tors . In Sec . 7-2 it was mentioned that the incident - beam intensity had to be maintained absolutely constant in a diffractometer and that this constancy required tube current and ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cosĀ² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone