Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
From inside the book
Results 1-3 of 36
Page 185
For any position of the counter , the receiving slit F and the x - ray source S are
always located on the diffractometer circle , which means that the face of the
specimen , because of its mechanical coupling with the counter , is always
tangent to a ...
For any position of the counter , the receiving slit F and the x - ray source S are
always located on the diffractometer circle , which means that the face of the
specimen , because of its mechanical coupling with the counter , is always
tangent to a ...
Page 187
Bernard Dennis Cullity. incident - beam slits 6 specimen S line source
diffractometer axis -receiving slit to counter of the plates , and these rays cause
the wedges of radiation to merge into one another a short distance away from the
exit slit .
Bernard Dennis Cullity. incident - beam slits 6 specimen S line source
diffractometer axis -receiving slit to counter of the plates , and these rays cause
the wedges of radiation to merge into one another a short distance away from the
exit slit .
Page 446
When is not zero , the focal point of the diffracted beam therefore lies between F ,
the usual position of the counter receiving slit , and the specimen . If the receiving
slit is kept at F , the intensity of the beam entering the counter will be very low .
When is not zero , the focal point of the diffracted beam therefore lies between F ,
the usual position of the counter receiving slit , and the specimen . If the receiving
slit is kept at F , the intensity of the beam entering the counter will be very low .
What people are saying - Write a review
LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
21 other sections not shown
Other editions - View all
Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | the University of California |
| Digitized | 3 Jun 2009 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |