Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
From inside the book
Results 1-3 of 81
Page 143
... Specimen holders . Before going into the question of specimen holders , we might consider the specimen itself . Obviously , a specimen for the transmission method must have low enough absorption to transmit the diffracted beams ; in ...
... Specimen holders . Before going into the question of specimen holders , we might consider the specimen itself . Obviously , a specimen for the transmission method must have low enough absorption to transmit the diffracted beams ; in ...
Page 164
... specimens which are not too highly absorbing . There is an optimum specimen thickness for the transmission method , because the diffracted beams will be very weak or entirely absent if the specimen is either too thin ( insufficient ...
... specimens which are not too highly absorbing . There is an optimum specimen thickness for the transmission method , because the diffracted beams will be very weak or entirely absent if the specimen is either too thin ( insufficient ...
Page 184
... specimen is not rotated as a Debye - Scherrer specimen is , the only way of obtaining an adequate number of particles having the correct orientation for reflection is to reduce their average size . Surface roughness also has a marked ...
... specimen is not rotated as a Debye - Scherrer specimen is , the only way of obtaining an adequate number of particles having the correct orientation for reflection is to reduce their average size . Surface roughness also has a marked ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
24 other sections not shown
Other editions - View all
Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cosē counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone