Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 269
... surface ground on a belt sander ; ( b ) after removal of 0.003 in . from this surface by etching . made at 300 ° and 450 ° C which would immediately suggest that the speci- men annealed at 450 ° C had the coarser grain size , but this ...
... surface ground on a belt sander ; ( b ) after removal of 0.003 in . from this surface by etching . made at 300 ° and 450 ° C which would immediately suggest that the speci- men annealed at 450 ° C had the coarser grain size , but this ...
Page 270
... surface discloses the cold- worked condition of a thin surface layer and gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective ...
... surface discloses the cold- worked condition of a thin surface layer and gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective ...
Page 444
... surface layer left in compression by the grinding . The surface is then lightly polished with fine emery paper , to remove the roughness caused by deep etching , and lightly re - etched . Surface rough- ness must be strictly avoided ...
... surface layer left in compression by the grinding . The surface is then lightly polished with fine emery paper , to remove the roughness caused by deep etching , and lightly re - etched . Surface rough- ness must be strictly avoided ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant cos² counter crystal cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spots stereographic structure substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone